| 1 |
Stevie, F. A.; Giannuzzi, L. A.; Prenitzer, B. I.
The focused ion beam instrument |
0 |
0 |
| 13 |
Giannuzzi, Lucille A.; Prenitzer, Brenda I.; Kempshall, Brian W.
Ion - solid interactions |
0 |
0 |
| 53 |
Stevie, F. A.; Griffis, D. P.; Russell, P. E.
Focused ion beam gases for deposition and enhanced etch |
0 |
0 |
| 73 |
Kaito, Takashi
Three-dimensional nanofabrication using focused ion beams |
0 |
0 |
| 87 |
Hooghan, Kultaransingh (Bobby) N.
Device edits and modifications |
0 |
0 |
| 107 |
Holdford, Becky
The uses of dual beam FIB in microelectronic failure analysis |
0 |
0 |
| 133 |
Gnauck, Peter; Hoffrogge, Peter; Schumann, M.
High resolution live imaging of FIB milling processes for optimum accuracy |
0 |
0 |
| 143 |
Phaneuf, M. W.
Fib for materials science applications: a review |
0 |
0 |
| 173 |
Anderson, Ron; Klepeis, Stanley J.
Practical aspects of FIB TEM specimen preparation: with emphasis on semiconductor applications |
0 |
0 |
| 201 |
Giannuzzi, L. A.; Kempshall, B. W.; Schwarz, S. M.; Lomness, J. K.; Prenitzer, B. I.; Stevie, F. A.
FIB lift-out specimen preparation techniques: ex-situ and in-situ methods |
0 |
0 |
| 229 |
Kamino, T.; Yaguchi, T.; Hashimoto, T.; Ohnishi, T.; Umemura, K.
A FIB micro-sampling technique and a site specific TEM specimen preparation method |
0 |
0 |
| 247 |
Young, Richard J.; Moore, Mary V.
Dual-beam (FIB-SEM) systems: techniques and automated applications |
0 |
0 |
| 269 |
Stevie, F. A.
Focused ion beam secondary ion mass spectrometry (FIB-SIMS) |
0 |
0 |
| 281 |
Dunn, D. N.; Kubis, A. J.; Hull, R.
Quantitative three-dimensional analysis using focused ion beam microscopy |
0 |
0 |
| 301 |
Principe, E. L.
Application of FIB in combination with Auger electron spectroscopy: a practical guide with examples |
0 |
0 |