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Stevie FA, Giannuzzi LA, Prenitzer BI. The focused ion beam instrument. In: Giannuzzi LA, Stevie FA, eds. Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. New York, NY: Springer; 2005:1-12. |
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Stevie FA, Griffis DP, Russell PE. Focused ion beam gases for deposition and enhanced etch. In: Giannuzzi LA, Stevie FA, eds. Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. New York, NY: Springer; 2005:53-72. |
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Giannuzzi LA, Kempshall BW, Schwarz SM, Lomness JK, Prenitzer BI, Stevie FA. FIB lift-out specimen preparation techniques: ex-situ and in-situ methods. In: Giannuzzi LA, Stevie FA, eds. Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. New York, NY: Springer; 2005:201-228. |
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Stevie FA. Focused ion beam secondary ion mass spectrometry (FIB-SIMS). In: Giannuzzi LA, Stevie FA, eds. Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. New York, NY: Springer; 2005:269-280. |
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