In recent years atomic force microscopy (AFM) has become one of the most popular nanometer scale objects manipulation tools. There are many laboratories around world that have been experimenting with AFM to manipulate nanometer objects. However, most of the reports are limited to experiments without providing theoretical analyses of the system dynamics behaviour.

In this thesis, we exploit the physical phenomena of the interactions between manipulation tool (AFM cantilever) and the nanometer objects. The objective is to introduce a simplified nanometer objects pushing system model. To achieve this research goal, the AFM cantilever is modeled as a three-dimensional force transducer. It can transfer the three-dimensional deflection signals measured by the detection system into three-dimensional force signals. The Johnson-Kendall-Roberts (JKR) contact model, which is selected to describe the contact interactions, is linearized by spring-damping systems. System parameters that may have an effect on the system dynamics are investigate by computer simulation. Through the results, users can design reliable nanometer object pushing experiment.